Used SPEA 4040 #9145863 for sale

SPEA 4040 is a prober used to measure semiconductor wafers to diagnose critical semiconductor parameters and crystal characteristics. 4040 enables users to analyze the surface roughness, topography, overall shape, and electrical characteristics of the wafer with a high degree of accuracy and precision. SPEA 4040 features a 500 mm x 400 mm table and offers a wide range of functions to measure wafers up to 300 mm in diameter. The prober is designed to make a wide range of electrical measurements including capacitance, resistance, transconductance, leakage, surface potential, voltage, cobalt testing, and more. The integrated software of 4040 make it easy to acquire, visualize, analyze, and report the results obtained from the prober. In addition to the advanced surface mapping technology, the advanced ribbon mapping technology can provide valuable information about the surface potential profile of the wafer. Moreover, SPEA 4040 features a unique contact verification system that minimizes contact scenarios and reduces contaminants and dust on the surface of the wafer. In addition, the system can relate the results obtained from the prober to various technical parameters to ensure accurate, repeatable, and reliable measurements. 4040 has an integrated user interface that makes it easy to use and allows for fast and effective measurements. In addition, the prober is designed with an expandable architecture that promotes scalability and enables integration of multiple hardware, software, and data acquisition systems within a single platform. SPEA 4040 is capable of maintaining critical operating parameters such as temperature, pressure, humidity, and other environmental conditions, making it the ideal device for high-quality semiconductor testing. Furthermore, the strongly shielded stages of the prober will minimize the effects of electromagnetism and other environmental disturbances, ensuring reliable measurements. In conclusion, 4040 is robust prober designed specifically for semiconductor wafer testing. With its advanced functions, wide range of capabilities, and user-friendly interface, SPEA 4040 is a reliable and dependable solution for any semiconductor wafer testing application.