Used SPEA 4040 #9199184 for sale

SPEA 4040 is a prober designed to meet all high-level testing requirements for semiconductor device testing. It is a fully flexible prober with the capacity to test multiple types of devices. 4040 is easy to use, yet powerful enough to accommodate the most advanced tests. SPEA 4040 features several different configurations. It couples a single electrical test head interface, and two vacuum platens, to provide the capability for testing both Digital as well as RF/analog devices. The instrument uses two wafer Probe Up/Down Chucks, allowing for dual-lot testing. The easy to use GUI and touchscreen interface makes programming tests, checking results, and accessing data smoother. It also features testing capabilities for on-wafer/hybrid/organic package types. 4040 prober is equipped with advanced electrical and physical measurements. It is capable of checking DC, AC/RF, and timing characteristics. It can measure voltage, from low-voltage up to 90V, current up to 10mA, capacitance up to 2000pF and resistance up to 1GOhm. The equipment tests electrical characteristics such as fall time, rise time, cross talk, bandgap voltage, access time, and gain. It also has the capabilities to detect shorts, opens, capacitance, and resistance in device under test. SPEA 4040 is a fully integrated semiconductor device testing system. It uses a single interface for electrical and mechanical testing, supporting both physical and electrical device operations. This integrated design reduces the number of components, helps to reduce costs, and contributes to speedier testing. The unit is also equipped with status/illumination indicators for quick checks on machine status or device run times. The key benefit of 4040 is its high performance and reliability. The prober has been designed and tested to provide faultless and highly repeatable results, while its all-in-one integrated design helps to reduce testing times. The versatile and customizable interface further contributes to an optimized and efficient testing process. SPEA 4040 is ideal for applications in semiconductor device testing, as it offers easy operation, maximum flexibility, and excellent performance.