Used SPEA 4040 #9199488 for sale

SPEA 4040 is a prober designed for high throughput wafer sorting and component testing. It is a high-speed, high-precision system that can be used to test integrated circuits, transistors, resistors, and other components. 4040 consists of a base unit, a control unit, a probe unit, and a test head. The base unit contains the power supply, amplifier, and main logic board. The control unit is used for controlling and monitoring the prober. The probe unit contains the contact probes, their carriers and drivers, and the probe card holders. The test head consists of the test head frame, sample plate, and sample plate gondolas. The prober can be set up and programmed for a variety of test applications. It can be set up to selectively probe any pin or any combination of pins on a device, in order to measure its characteristics. The prober can also be set up to test all pins on a part, for a complete characterization. SPEA 4040 has a very fast sorting speed. It can sort a 2-inch wafer in about a minute, and a 4-inch wafer in about two minutes. The prober also has a very sensitive probing capability. Its sensitive force and current measurements enable it to detect even the smallest changes in the wafer material properties, making it ideal for fault diagnosis. The prober has a robust mechanical design, which allows for operation in harsh environments. It also has configurable repeatability and off-normal functions, so it can recall and repeat the same test conditions for multiple devices. Finally, 4040 has several safety features. It has emergency all-stop inputs, alarms, carriages with built-in safety devices, and an on-board safety monitor. All these features ensure that the operation is secure and efficient. In summary, SPEA 4040 prober provides a fast, accurate, and reliable test solution for a variety of devices. It is equipped with several safety features, making it suitable for use in hazardous environments. Its ability to quickly sort a wafer and provide sensitive probing capabilities makes it an ideal choice for high throughput wafer sorting and component testing.