Used SPEA 4040 #9203917 for sale

SPEA 4040 prober is a specialized test and measurement device designed to provide accurate and reliable electrical testing of semiconductor devices. This prober is used in the production and analysis of complex integrated circuits (ICs). It enables device probing and electrical testing from large-scale production to final on-die testing and beyond. 4040 prober is a fully-automated platform, designed to test multiple devices, and offers advanced calibration capabilities. It is capable of handling virtually all types of packaged devices, including ball grid arrays (BGAs), molded plastic leadframe (MLP), and quad flat packs (QFP). The prober is also capable of testing ICs from 0.2mm to 6 x 6mm and features an option for dual-die probe testing. The prober is equipped with a Scanning Electrical Microscope (SEM) that is capable of collecting multiple electrical and optical images, which can be used for signal integrity and device programming. Additionally, the platform is able to analyze dynamic electrical parameters such as source-drain leakage, capacitance, gate voltage, read/program time, and clock speed. For optimal accuracy and repeatability, SPEA 4040 prober features a static-controlled environment with active air conditioning which is automatically adjusted to maintain a constant temperature throughout the testing process. It also comes with an automated system for overheads and process control, allowing users to monitor and control the entire testing process and identify any potential issues. This prober is designed with a pressure-sensitive chuck, and can accommodate a variety of different probe card designs. It is equipped with a high-resolution digital measurement system that allows precise data acquisition up to 6GHz, as well as non-contact precise digital alignment during operation. Finally, 4040 prober is compatible with several different test software platforms, allowing users to customize their testing protocol and create reports quickly and accurately. It is routinely used in final test engineering, product engineering, and production engineering applications.