Used SPEA 4040 #9256464 for sale

SPEA 4040 is a prober designed and manufactured by SPEA, a Swiss-based test equipment specialist. 4040 prober is a physical testing tool that allows a user to quickly and accurately make measurements and extract data from wafer-level components. It supports a wide range of wafers, including those of different package sizes, various layer types, and even multiple ground layers. SPEA 4040 has a high accuracy and a low min & max test time, making it suitable for high-volume production. 4040 prober comes with a rotary XY stage that is capable of moving the wafers in the X, Y, and Z axes. It features an integrated vision system which enables high positional accuracy across multiple layers and types of wafers. Additionally, SPEA 4040 has a built-in, high-resolution LCD display to monitor the exact position of the wafer and to quickly locate anomalies. The prober also has the capacity to detect, measure and analyze multiple electrical parameters, such as resistance, current, temperature, power, and voltage. It also includes data acquisition hardware and software that assist in wafer automated testing. This automated testing system eliminates the need for manual testing, saving time and effort. 4040 prober is equipped with an open platform design, allowing for easy customization and integration of external components or software. It has a user-friendly operating system that requires minimal user-input and provides customer-friendly feedback. SPEA 4040 prober is intended for use in a variety of manufacturing applications such as quality control, product validations, and failure diagnostics testing. It is also compatible with a wide range of component packages, making it suitable for many different applications. Overall, 4040 is a reliable, accurate, and user-friendly prober designed by SPEA to meet the needs of the semiconductor industry's ever-growing demand for faster and more accurate wafer testing. It provides a high level of flexibility and performance, enabling engineers and technicians to quickly and accurately analyze electrical parameters on a variety of wafers.