Used SPEA 4040 #9256490 for sale

Manufacturer
SPEA
Model
4040
ID: 9256490
Vintage: 2004
Flying probe tester Hi-Line Series 5 (4) Top side probes Test area: 50 x 400 mm top side Internal graphic printer: 24 lines/sec Footprint: 1755 x 1240 mm Board conveyor height: 850 mm (SMEMA) Pressure: 0.7 Mpa Operating system: Windows Manuals and spare parts included Power supply: 208 V, 50/60 Hz, 3 Phase, 6 kVA 2004 vintage.
SPEA 4040 prober is designed to meet the testing needs of next-generation semiconductor devices. The prober utilizes innovative and advanced technology to provide a high performance, tested testing system. It is user friendly and equipped with superior probing and testing capabilities. The prober consists of three main components; the prober body, the macro unit, and the vision unit. The prober body is a robust and versatile platform that provides the user with a flexible testing solution. It is equipped with a quick-change test head which is equipped with probe tips that can be quickly and easily changed. The prober body also houses the monitoring and control systems that are responsible for controlling the testing process. The macro unit is responsible for precision positioning and alignment between the board being tested and the probes. The unit is equipped with highly precise microphones and cameras that enable the system to monitor the alignment of the board and the probes. The vision unit is the most advanced component of the prober. It consists of several cameras that monitor the movement of probes during testing. The cameras are used to generate a high-resolution image of the board being tested. These images are then processed by a software that allows users to validate testing parameters and results. 4040 prober is a powerful testing system designed to provide users with an advanced testing solution. The prober is user-friendly, and its advanced technology ensures that it accurately and quickly captures testing information. Additionally, its easy to use interface allows users to access and analyze the testing results quickly. This prober is designed to provide reliable testing results suited for next generation semiconductor devices.
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