Used SPEA 4040 #9404479 for sale

SPEA 4040 is a prober specifically designed for electrical testing and burn-in of chip assemblies. It features four independent probe stages, each capable of measuring up to 40 test points, as well as advanced diagnostics, ultra-low noise electrical characteristics, and fast response times. 4040 operates by applying a series of low-voltage pulses to each test point and measuring the differences in the response from each probe stage. The pulse width and pulse current can be customized on each channel to optimize the signal-to-noise ratio, allowing for the best possible results from the testing process. SPEA 4040 also includes advanced diagnostics, allowing for fast and reliable diagnosis of any faults detected. 4040 also excels at burn-in testing, providing quick and reliable results. This is thanks to its fast response times and its ability to measure up to 40 test points simultaneously. This allows for quick identification of thermal cycling and electrical failure, ensuring that each and every unit is tested accurately and at the highest possible quality. In addition, SPEA 4040 provides excellent noise suppression characteristics, reducing the number of false positives in the testing and burn-in processes. This enables high throughput and more accurate results. With all these features, 4040 is the ideal prober for electrical testing and burn-in applications. Its low-noise operation and high-accuracy results make it a highly reliable prober, and its fast response times and robust features ensure that testing and burn-in results are accurate and reliable. Its ability to test up to 40 test points simultaneously also makes it highly suitable for large-scale production.