Used SPEA 4040CC #9151874 for sale

SPEA 4040CC is a state-of-the-art wafer prober designed to provide accurate and efficient die testing. It is the latest in SPEA range of probers and features a 40 nozzle modular setup for greater flexibility and 12 placement channels for increased throughput and improved process efficiencies. This high performance prober is capable of measuring any wafer with diameters between 3 inch and 8 inch. 4040CC is designed with an optimized air flow system for good wafer handling and improved isothermal hot plate. Additionally, the prober features an STI depth measurements of up to 3 #204 in / 76.2 mm with multiple interior depths. The repeatability of its relocation system is rated up to +/- 10 um and a minimum deviation in thermal conditions of 2°C. It is also equipped with advanced vision systems for better alignment and seam up to 0.2 um accuracy, combined with a high resolution linear encoders for precise positioning. SPEA 4040CC prober is further equipped with dedicated software for data logging and fast die testing. The prober is capable of a maximum test frequency of 500 kHz, and includes an innovative precision feed system for better product stability and reliability. 4040CC is designed to increase your throughput in testing and provide great yields with its high flexibility and reliable operation. The prober is easy to use and maintain, making it ideal for applications in a wide range of industries. It is designed to allow for quick setup and changeover processes to maximize productivity and minimize delays. SPEA 4040CC can be a powerful and reliable tool for wafer testing. The robust design and automation features ensure fast and efficient processing, while the accuracy and repeatability of the prober guarantee reliable yield and high quality results. In addition, the intuitive software and advanced vision enhance the overall process performance and the calibration capabilities ensure maximum accuracy.