Used TAKAYA APT 3050 #293596459 for sale
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ID: 293596459
Vintage: 2004
Circuit tester
Computer
Cards: A, B, C
9-Pin cards
2004 vintage.
TAKAYA APT 3050 is a state-of-the-art prober designed for wafer probing applications and other IC package test and debugging activities. The prober is capable of providing high precision and repeatability in the test and evaluation of today's advanced semiconductor devices. The probe chambers of TAKAYA APT-3050 feature 20,000 micro-probes enabling parallel testing of multiple devices and simultaneous testing of individual devices in different modes. The mechanism is based on an air bearing design for secure, accurate, and smooth contact transfer, providing reliable operation even at very low pressure. The prober is additionally equipped with around 25 high power LEDs, providing superior illumination for accurate image acquisition. APT 3050 is built on an 8-Axis XYZ system and comes with standard 9-Axis options for complete device characterisation and evaluation. The prober is ideal for various applications such as manual wafer probing and char-acterisation, localised probing and die-level test, high-speed wafer sorting and high-density probing. Additional features include multi-site testing, automatic handling, multi-site characterisation and real-time data acquisition and analysis. The prober is also equipped with a host of automated features such as high-speed autofocus, precise low force air ball contact probing, contamination-free operation, along with library support and high-precision motion control. The user interface is designed to beintuitive, with an ergonomic controller featuring dedicated function keys as well as data entry fields. To provide optimum support for applications, APT-3050 also includes a suite of software tools for online analysis, imaging and statistical data processing. TAKAYA APT 3050 is an ideal solution for a wide range of applications in the semiconductor industry. Its precise and repeatable testing capabilities are both economical and flexible, enabling customers to cost-effectively characterise and evaluate devices down to the micron level. The prober offers superior precision, long-term reliability and robust performance for any research, development or production testing requirements.
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