Used TAKAYA APT 7400CN #9194426 for sale

TAKAYA APT-7400CN is a versatile prober designed for advanced production and R&D testing. It is the perfect solution for the needs of high-performance semiconductor failure analysis, metrology, and qualification environments. Equipped with an intuitive, easy-to-use graphical user interface, APT-7400CN allows users to quickly set up and configure test parameters and test levels. TAKAYA APT-7400CN prober provides a variety of performance levels and features that are ideal for microelectronic testing, failure analysis, and other specialized applications. APT-7400CN is designed with a dual-axis shuttle that ensures constant, exceptionally stable parallel and perpendicular alignment accuracy over a wide range of temperature cycling and vibration conditions. In addition, it features an optional XY scanning stage for high-precision probing and greater versatility in multiple applications. Utilizing a CCD image equipment, an ambient temperature compensator, an ergo hand feeder, and a unique "pocket-shaped" probing arm, it is able to deliver the highest probing accuracy available. TAKAYA APT-7400CN is equipped with an array of advanced test features and programming tools that allow users to quickly and accurately configure their tests. It features simple, easy-to-use on-board controls such as position indicators, temperature/humidity compensators, as well as a variety of external devices and programming options. These include low-level frequency, parametric, digital, differential, and parametric/measurement test configurations. Additionally, it supports DC level and frequency test parameters with up to 500kHz of adjustable signal frequency covering a wide range of devices. APT-7400CN is designed with an integrated environmental sensor system that is designed to monitor, control, and optimize the temperature and humidity of the unit. It can also be configured with optional force-sensing and vacuum probing technology, giving users more flexibility and accuracy. Additionally, the unit is also equipped with an integrated die attach capability that gives users the flexibility to attach a variety of device packages to the substrate. TAKAYA APT-7400CN is designed with a variety of safety features that are designed to protect its users and the environment. The unit features an enhanced security unit, as well as an integrated thermal control machine, which is designed to limit the maximum temperature of the device. Additionally, it features three-layer protection against dust, vibration, and the environment. Finally, APT-7400CN is CE and IEC compliant, allowing it to be used in a variety of industrial applications. In summary, TAKAYA APT-7400CN is a versatile prober that is perfect for producing high-performance test results and reliable data. Its comprehensive test features, integrated environmental sensor tool, and safety features make it an ideal choice for a wide range of semiconductor applications.