Used TAKAYA APT 8400 #9209911 for sale

TAKAYA APT 8400 is a prober for integrated circuits, comprising a motorized XY stage which is used to manipulate the probing size, a Z-axis stage for varying the vertical height and a probing arm including a vacuum tool that is used to grip and position the probe tip. The prober is capable of high frequency scanning and is ideal for inspecting large scale integrated circuits as it can quickly and accurately measure and record electrical parameters such as transistor gate leakage, short circuit current, and open resistance. APT 8400 features a CCD (Charge Coupled Device) camera for visual inspection and alignment of probes while the probing arm offers a quick and easy gripping and positioning of the probe tip for scanning. The prober comes with three axes stages for independent fine positioning of the probe tip and provides detection of overdriven, damaged, and outlying probes. TAKAYA APT 8400 allows for a wide list of throughput settings and offers a stable and reliable base platform. The software of the prober features an easy-to-use graphical user interface (GUI) that allows users to set up multi-protocol experiments, perform statistical analysis, save reports, and customize protocols. Furthermore, APT 8400 features auto-calibration and probe continuity checking, providing a extremely accurate testing environment for the fabrication of ICs. Featuring an integrated XYZ translation stage, TAKAYA APT 8400 is an excellent choice for fast, accurate probing and testing of integrated circuits on board within an affordable and compact package.