Used TAKAYA APT 8400 #9254104 for sale

TAKAYA APT 8400 is an advanced prober designed for probing high-pin-count application-specific ICs (ASICs). The prober includes a variable gap load frame and TS Manufacturing's world-renowned XYZ probe stages for improved probing precision as well as advanced vision and automated alignment systems. The unique design of the prober makes it a great solution for technology nodes that require the highest degree of accuracy and reliability. The variable gap frame design of the prober enables easy setup and operation, as well as allows for the fast, accurate adjustment of pitch and height of probe pins. The ultra-low-noise XYZ probe stages feature sub-micron resolution capability, enabling very high accuracy probing. High frequency probing is also supported. The automated bayesian shap alignment system provides accurate results with minimal calibration time, making it an ideal solution for probing narrow design tolerances. It supports the alignment of probes well beyond the probe's native measurement capability. The vision system enables automatic insertion of devices into the prober, as well as fast pick and place operations. The 8400 features a range of process controls for independent control of both pressure and current. Utilizing a flexible adjustment setting, the prober can accommodate a variety of probe cards and substrates. It also features a compact, high-density probing area for testing high pin-count devices. In summary, APT 8400 is an advanced prober designed to increase accuracy and reliability when probing high-pin-count ASICs. It includes a variable gap load frame, highly accurate XYZ probe stages, advanced vision and automated alignment systems, and a range of process controls. Combined with its compact, high-density probing area, the prober is ideal for testing small or technology-challenging devices.