Used TAKAYA APT 8400CE #145870 for sale

TAKAYA APT 8400CE is a prober designed for testing semiconductor chips and components. This prober can operate up to 10 different load boards, making it ideal for high-volume testing in the wafer environment. It features a low noise jig and can handle a wide variety of test parameters, including AC logic levels, DC logic levels, pulse testing, leakage current measurements, and much more. The prober also provides an integrated wafer handling equipment with a 15-pin tape-down station. TAKAYA APT-8400 CE is designed for maximum accuracy and reliability in the field of semiconductor testing. It employs a contact measurement system utilizing gold-plated probes with retractable ground rings, allowing for a safe and reliable contact every time. The prober also uses an intelligent temperature control unit, featuring an on-site temperature readout and air conditioner for maintaining optimal testing temperatures. APT 8400CE features a number of data analysis and display features. The prober can display multiple prober scans and the detailed measurement data, which can be used to create test charts and statistical charts to reflect actual test results. Additionally, the prober is able to execute complex load board sequences, enabling tests to be conducted in parallel on multiple load boards. APT-8400 CE is equipped with a high-speed processor with advanced timing and synchronization features. This enables the prober to measure various features in parallel, resulting in extremely precise results. The high-speed recognition machine built into the prober also allows it to quickly recognize the internal logic of a device, which makes the testing process more efficient. Overall, TAKAYA APT 8400CE is a powerful and precise prober designed for the most demanding test applications in the semiconductor industry. With a variety of data analysis and display features, it is capable of producing extremely precise results. Additionally, the on-site temperature control and versatile load board sequences make it suitable for a range of testing requirements.