Used TAKAYA APT 8400CE #148721 for sale

TAKAYA APT 8400CE is a state-of-the-art advanced prober for wafer probing. It has outstanding accuracy and high throughput for automated production testing of complex discrete devices, 3D ICs, and MEMS. TAKAYA APT-8400 CE offers a wide range of probing options, including vertical probing, horizontal probing, force sensing probing, and pressure-controlled probing. APT 8400CE is designed to provide a high-resolution image for device probing. It is equipped with a high-resolution optics system combined with a fast imaging technology that enables high throughput and measurement accuracy. A parallel imaging system with dual lasers also helps reduce measurement errors. This prober is designed to offer maximum efficiency and precision while reducing the complexity and cost of testing. Its innovative parallel signal detection technology allows simultaneous probing of multiple test points in the same area, so test times are greatly reduced. The prober also features a high-speed asynchronous signal acquisition with precision signal analyzer that enables accurate testing on complex devices. APT-8400 CE has a high-speed head positioning system to allow rapid movements between test points with a repeatability accuracy of 0.5 μm. It has multiple vacuum pumps to ensure consistent vacuum control over the test area and fast moving heads. An auto-tilt option eliminates the need for manual adjustment of the probing head. TAKAYA APT 8400CE also includes the innovative FIBERMUX™ Texturing option, which allows for the wafer texture measurements at multiple points in a single measurement session for analyzing device performances. The optional PAM-5000 software module provides support for multiple languages and helps improve device probing. With its integrated analysis tools and versatile capabilities, TAKAYA APT-8400 CE is a powerful prober solution that provides reliable, precise, and cost-effective production testing. It offers a complete solution for advanced probing and testing, allowing users to optimize their production test operations.