Used TAKAYA APT 8400CJ #293657386 for sale

TAKAYA APT 8400CJ is an advanced prober designed to improve the efficiency, accuracy and reliability of semiconductor device test and parametric measurement. The prober combines a high-speed wafer probing platform with innovative technologies for self-alignment, scan head loading, and horizontal and vertical servo-controls. The 8400CJ has the capability to test up to eight devices simultaneously, and can offer up to sixteen testing configurations. The 8400CJ utilizes high-accuracy scan-head mounting techniques to achieve precise device placement on the prober. With its innovative pattern-recognition-based self-alignment (PBS) feature, the 8400CJ can accurately detect the size and shape of the device being tested and automatically adjust its testing parameters as needed. This ensures consistent quality during device testing. Another important feature of the 8400CJ is its powerful micro controller architecture. This feature allows the prober to run faster test cycles while maintaining precise temperature and humidity control. This helps improve accuracy for faster recalibration time. The 8400CJ also integrates power regulation and instrumentation for better control over device performance. In addition to its advanced features, the 8400CJ offers quick and easy setup and calibration. An intelligent user interface guides the user through the whole process, from contacting to verification. The comprehensive, user-friendly design allows for easy and intuitive troubleshooting. Overall, TAKAYA APT 8400 CJ is a reliable and accurate prober designed to greatly improve semiconductor device test and parametric measurement. With its advanced capabilities and comprehensive features, the 8400CJ is well-suited for use by engineers, researchers, and scientists. It is an ideal choice for getting reliable test results in a short amount of time.