Used TAKAYA APT 8400CJ #293754084 for sale

Manufacturer
TAKAYA
Model
APT 8400CJ
ID: 293754084
Vintage: 1996
Flying prober (4) Moving probes Operating system: DOS Power supply: 220 VAC 1996 vintage.
TAKAYA APT 8400CJ is an advanced, automated probe station designed for high-level quality testing and measurement. It is tailored for quality control in semiconductor mass production, making it an ideal choice for quality assurance in the chip industry. TAKAYA APT 8400 CJ is a two-level system that consists of a base station and a probe station. The probe station is designed to allow high-precision placement of both probes and other measurement and test equipment. It has a large work surface capable of accommodating samples up to 150 x 150 mm, as well as enough space to mount probes, tips, and other components. The base station features a powerful mainframe, enabling reliable data acquisition and communication with other instruments. APT 8400CJ is equipped with high-speed motors, allowing for quick and accurate sample positioning. It also offers versatile temperature options and programmable oven temperature profiling to achieve the desired electrical test environment. In addition, the probe station has a vibration-less design and an easily accessible wafer chuck and sample holders, allowing for easy and efficient sample installation and manipulation. For automation, APT 8400 CJ offers advanced features like Macro programming, auto-Z sensing, and vector programing technologies. It also has a self-calibration function which ensures accuracy and precision in the measurements taken. The probe station also comes with a range of test and measurement modes, including temperature testing and IC characterization, making TAKAYA APT 8400CJ perfect for use as a precision workstation for quality control in semiconductor mass production. The system is also designed for use in high-volume production line testing, and it can show pass/fail results quickly, significantly reducing production time and costs. Overall, TAKAYA APT 8400 CJ is a high-precision, automated probe station tailored for quality assurance in semiconductor production. With its advanced design and versatile features, it is the perfect choice for chip manufacturing and testing.
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