Used TAKAYA APT 8400CJ #9350684 for sale

TAKAYA APT 8400CJ prober is a piece of equipment used for the electrical testing and probing of small to medium sized semi-conductor devices. It is a fully automated, multi-probe, micro-positioning system which employs a highly accurate, integrated microscope system for accurate handling of small probes. TAKAYA APT 8400 CJ uses a combination of XYZ as well as rotating and tilting stages for full flexibility during testing and probing. The system provides excellent repeatability and is capable of probing along multiple sides of a device with spectacular accuracy. The accuracy of the positioning systems allows for probing contact points on silicon wafers as thin as 0.10mm and as long as 12mm. Variations in substrate parameters are taken into account through adjusting the Z and rotational axes. To maximize accuracy and efficiency, APT 8400CJ can consistently capture the parameters of the parts or devices. A variety of separately operated probe heads are used for multi-probe testing and each one can have individually adjustable power outputs. Additionally, probes can be changed rapidly, which cuts down on the testing process. On top of a powerful motor drive, the prober offers sophisticated electronic control operations which can maximize stability and efficiency. APT 8400 CJ is equipped with independent measurement components and advanced microprocessing which provides robust parameter setting for testing accuracy. The measurement estimates the contact between probes and devices samples, while the data analysis, which includes calculation of current and voltage timing, ensures optimal testing results. All in all, TAKAYA APT 8400CJ prober is an ideal all-in-one solution for small to medium-sized semi-conductor device probing. With its full automation, integrated microscope systems, advanced motor drives, and independent measurement components, it ensures accurate, efficient probing of small, delicate parts.