Used TAKAYA APT 9401 CE #293653800 for sale
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ID: 293653800
Vintage: 2006
Flying prober
(4) Moving probes
2-IC Open pins
TOS-41 Camera system
Test steps: 300000
Guarding: 2-points/step
Test speed:
Combination test method: 0.03~0.05 sec/step
Single test method: 0.08~0.10 sec/step
X-Y Positioning repeatable accuracy: ± 50 μm
Probe contact pitch: 0.18 mm
Low value resistance: 40 mΩ - 400 Ω
Resistors: 0.4 Ω - 40 MΩ
Capacitors: 4 pF - 40 mF
Inductors: 4 μH - 400 H
Impedance: 33 Ω - 330 KΩ
Diodes/Transistors: 0.1 V - 2.5 V (VF)
Zener diodes: 0.4-40 V
Relays: On test (Option, DC 24 V/1 A)
Vision system:
Pattern matching search method
Black/White Micro CCD Camera
Red/Blue-LEDs Illumination
Function: Simple vision test (Missing, position, polarity)
Coordinates management system:
Point system and teaching system (two combination)
Printer: Dot impact type / Thermal type
Temperature: 15-30°C
Humidity: 35-70%
Compatible PC/AT
HDD, FDD and CD-ROM Drives (installed)
LCD Monitor: 15"
Resolution: 1024 x 768 dots with high color
Operating system: Windows NT / 2000 / XP
Power supply: 200 - 240 VAC, 50/60 Hz, 3 kVA, Single phase
2006 vintage.
TAKAYA APT 9401CE is a precision prober designed for failure analysis of electronic devices and components. It is an important part of semiconductor manufacturing processes and is frequently used for verifying functionality of integrated circuits, test and measure devices, and other electronic components. APT 9401CE offers an impressive array of features, making it a versatile and reliable tool for testing a wide variety of devices. It features a high-tech, ergonomic interface allowing operators to easily program the prober and conduct tests without training. The user-friendly LCD touch-screen offers a simple, intuitive and interactive platform to control the device, offering operators feedback and simple programming. The prober also offers advanced features such as thermal profiling and 3D yield analysis - allowing users to interpret the performance of their devices over time. The prober is equipped with a superb XY variable vacuum chuck, allowing operators to comfortably probe different-sized components. It includes a removable cantilever probing arm with low spring force to reduce wear and tear. Furthermore, the variable vacuum chuck is automated, making it easier for users to switch between components. TAKAYA APT 9401CE is prepared ferro-magnetic devices, semiconductor components, and digital devices which operate at high temperatures. It is designed with automation and high accuracy in mind, featuring a built-in temperature compensator to ensure accuracy across temperature ranges. The prober is also equipped with a wide range of sensors, enabling users to measure more than one device at a time, as well as analyze curved surfaces for components with non-flat surfaces. APT 9401CE is a customizable and reliable prober, offering a variety of probes, software, accessories and options. The prober is especially well suited to failure analysis and testing of integrated circuits, test and measure devices and other electronic components. With its high accuracy and wide range of features, TAKAYA APT 9401CE is sure to provide reliable performance and lead to accurate device testing.
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