Used TAKAYA APT 9411CE #293762873 for sale

TAKAYA APT 9411CE is a high-performance prober designed for accurately detecting and measuring defects in integrated circuits and other semiconductor structures. With a Z stage of 250 μm and an X/Y stage of 40 mm, TAKAYA APT9411-CE allows for precise measurement and analysis of patterns across a wide area of the device. The equipment is also equipped with variable speed, high-resolution XYZ stages, which allow for precise, accurate and repeatable scanning of any cross section or feature of a sample. APT 9411 CE employs a variety of high resolution optical probes which can be used to map and measure a variety of device parameters, including surface, edge and film thickness. A variety of dielectric, capacitance and leakage currents can also be measured. The system also includes an Image Pre Processor, which allows for the automated detection of defects, as well as advanced software features like a LogiGrid Pro feature and a Device Fabrication Processor. TAKAYA APT-9411 CE has a large color display, intuitive touch-screen interface and a variety of input/output tools, making it easy to use even for inexperienced users. It is also equipped with an advanced automated alignment unit which allows for easy and accurate positioning of probes and samples. In addition, the machine is equipped with advanced temperature control technology that ensures precise thermal control and stability during measurements. APT9411-CE is designed to accommodate a variety of process conditions, making it an ideal solution for a wide range of semiconductor testing applications. Its fully automated design also eliminates human error and significantly reduces testing time. The tool's advanced capabilities make it ideal for reliable and precise defect analysis and other semiconductor measurements. Combined with its intuitive user interface and advanced features, APT 9411CE is an ideal choice for a variety of semiconductor testing and production applications.