Used TEKTRONIX J6501 #9157760 for sale

TEKTRONIX J6501
Manufacturer
TEKTRONIX
Model
J6501
ID: 9157760
Illuminance prober.
TEKTRONIX J6501 is a high precision prober used in semiconductor device testing and characterization. It is designed to provide the highest levels of accuracy and repeatability during probing operations. J6501 is a high-performance probing equipment with fast probing rates up to 15 μs/point for highly efficient results. It is equipped with a two-axis microprobe manipulator and has a full-color 6.5-inch touch display with data entry. The system provides a broad range of features for test probing including multiple load/force control capabilities, advanced compensation algorithms, and advanced feedback loops for consistent results. The package also includes an integrated interlock unit that ensures safety during operation. The prober is designed with a hybrid cross-axis architecture that allows for maximum accuracy and repeatability. The machine includes a motorized probe and adjustable stage for dynamic testing including sweep modes, dwell modes, and step-stair modes. The two-axis microprobe manipulator has two separate axes of control that enable improved control of probing operations. It also includes a suite of advanced software tools, enabling users to design test plans, setup probing sequences, and analyze performance results. The tool provides real-time force feedback with high accuracy, enabling repeatable measurements. It supports both balanced and unbalanced probes, and has a built-in asset controller that allows for high flexibility and scalable operation. The 32-bit microprocessor ensures high processing speed and enhanced measurement accuracy with small footprint. TEKTRONIX J6501 is a highly reliable and accurate prober for test and characterization of semiconductor devices. It offers a wide range of features for efficient and accurate testing. Its high accuracy motorized probe and adjustable stage are designed for dynamic testing, while its advanced software suite facilitates custom test plans and data analysis. With its hybrid cross-axis architecture and high-efficiency force feedback, the prober provides consistent results for precise measurements.
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