Used TEKTRONIX TCP 202 #9094483 for sale

TEKTRONIX TCP 202 is a high performance, low cost, general purpose prober designed for precision characterization of integrated circuits, power semiconductor devices, and other electronic and optoelectronic components. This prober has been engineered with a high level of automation, incorporating both mechanical and electrical automation. With its ergonomic design, TEKTRONIX TCP202 offers proximity positioning, autofocus and adaptive scanning functions to enable highly accurate and repeatable measurements. TCP-202 is equipped with an optically-based alignment system, which is capable of scanning up to 10x faster than manual alignment, making it ideal for high-throughput applications. It also features an intuitive calibration system that allows quick and accurate correction of any misalignment or tip measurement errors. To further simplify system setup and operation, the prober has an internal power supply with a choice of multiple output voltages as well as an adjustable output current, making it capable of powering both linear and AC devices. This prober is designed for robustness, enabling it to operate in a variety of extreme environments without compromising on accuracy or precision. Its 0.50 stress controlled XY stage compensates for thermal, gravitational and inertial changes, ensuring repeatability in temperature environments up to 100°C. Its innovative XY-Z stage design also ensures repeatable relative position between the tip and sample of up to 0.050 µm. This precision ensures accurate measurements, even on small feature sizes like microbumps. TEKTRONIX TCP-202 also offers a variety of scanning patterns, allowing users to optimize measurement repeatability. XY, XS, Z and variable raster scanning pattern are available, enabling different scan types to be programmed for optimal efficiency and accuracy. Overall, TCP202 is a powerful and versatile prober that offers a wide range of automated functions and features designed to simplify and speed up ic and other device testing at an affordable cost. Its precise movement and position accuracy make it ideal for characterizing a range of semiconductor devices, making it the perfect choice for production testing, engineering characterization, and research applications.