Used TEL / PANASONIC UF 2000 / LP-V10P #9306152 for sale

TEL / PANASONIC UF 2000 / LP-V10P
ID: 9306152
Vintage: 2016
Automatic laser scratch system 2016 vintage.
TEL / PANASONIC UF 2000 / LP-V10P is a prober designed for testing semiconductor devices. It uses a vertical probing methodology and was designed for high-precision probing across a wide variety of precision probing applications. It is considered to be a semiconductor wafer testing tool used for a variety of functions such as rapid probing, product debugging, technology evaluation, test-failure analysis, high-resolution probing, etc. The prober equipment consists of a global base station (GBS), which houses an XYZ-axes motorized linear stage and is provided with a touch panel controller with display. It also features a highly responsive active XYZ structure with a closed-loop position feedback system and high-stability vibration-proof design. This structure is capable of ensuring a high-precision probe placement accuracy. Each stage of the GBS is equipped with manual adjustment capabilities for fine-tuning of the probe position. The prober is also equipped with an optical inspection unit, which features a 5-micron-resolution CCD camera, a high sensitivity differential amplifier (high-gain), and a signal processing software. This machine is capable of providing a clear, accurate image of a device under test. The optical tool also supports high-speed probing for ultrafast product debugging processes. The prober also supports fine probing, a technique for probing devices with small contact pads. Fine probing is capable of analyzing four contact pads simultaneously, which significantly improves productivity. It also features a wide temperature range of 0-50 Celsius, which is suitable for a variety of testing conditions. In addition, the prober is capable of measuring a variety of parameters including resistance, capacitance, voltage, leakage current, and false contact on hall-effect sensors. It also features a variety of optional adapters such as a flexible clamp adapter, a probe holder, and a tweezer. These accessories make it easier to create effective test fixtures. Furthermore, the asset is provided with an operator-friendly PC software, which is capable of handling a variety of parameters related to the prober. It supports various data files such as CSV, ASCII, and Binary. It is also capable of providing a variety of probe patterns including linear, radius, and random probing. Overall, TEL UF 2000 / LP-V10P prober is a state-of-the-art testing model that is ideal for a variety of testing applications. It provides a highly precise probe positioning accuracy, supports optical inspection, fine probing, and a host of other functions to ensure an efficient testing experience.
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