Used TEL / TOKYO ELECTRON 19S #293616023 for sale

TEL / TOKYO ELECTRON 19S is a high performance prober that features super-fast probing, ultra-precise positioner accuracy, and exceptional impedance performance. With its high-speed probing performance, TEL 19S is capable of ten times the throughput of other probers. It can accurately find and measure devices in highly-populated areas on the wafer, and its high resolution optical zoom function allows for ultra-precise alignment of features. TOKYO ELECTRON 19 S has a large FOUP (front opening unified pod) which allows for the rapid transfer of wafers to and from the chamber. The chamber contains a high-pressure, low-vacuum environment which enables highly-efficient probing of a variety of wafer types, including engineering, bare and packaged die. The chamber can also be equipped with options such as a robotic arm that is capable of loading/unloading multiple wafers. TEL / TOKYO ELECTRON 19 S is equipped with a 3-axis, 4-inch positioner that achieves an absolute accuracy of ~10 μm. The positioner is highly reliable and is able to achieve repeatability of ±5 μm. It also has a large operating temperature range of up to 600°C, which allows for the testing of high-temperature devices. TOKYO ELECTRON 19S is equipped with a broad range of probes for accessing a variety of different wafer types. The probes that are used with TEL 19 S are able to accurately detect devices buried in ground planes and devices connected to high-speed traces. Furthermore, 19S is capable of measuring complex RF signals, ensuring optimal measuring sensitivity and repeatability. 19 S is also equipped with an impulse generator for measuring the impedance of devices on the wafer. This capability allows for the testing and characterization of advanced analog, digital, and mixed-signal conditions. The impulse generator features a fast rise time of 200 nsec and pulse width resolution of 100 nsec. Overall, TEL / TOKYO ELECTRON 19S is a reliable, high-performance prober that is designed for fast and precise probing of a variety of wafer types. It has a wide range of probing and impedance-measuring capabilities, and its high temperature operating range makes it a great choice for the testing of complex, high-temperature devices.