Used TEL / TOKYO ELECTRON 19S #9125641 for sale

TEL / TOKYO ELECTRON 19S prober is a highly precise, advanced prober equipment used for measuring and testing integrated circuits. This prober is composed of a fully-automated, closed-loop wafer handling system, a wafer aligner and a robotics-controlled needle scanning unit. It utilizes precision linear motors and a three-axis stepper and x-y-z stages to ensure accurate alignment and precise positioning of the needles. TEL 19S prober is capable of testing up to 300 contact sites per second, even with contact site sizes less than a micron, through its high-precision motion control technology. Additionally, the machine offers extended operation functionality for advanced signal integrity testing for semiconductor devices. Furthermore, the tool has advanced capabilities for synchronizing signal measurement with needle position to achieve high-accuracy signal measurements, thus making possible signal noise testing and fault localization. TOKYO ELECTRON 19 S prober can also be augmented by dedicated software such as wafer probers, pattern generators, diagnostics, self-alignment and test asset functions to make the user's test process far more efficient. Moreover, the model has the ability to adapt to different user needs and configurations. This flexibility and scalability helps to simplify complex processes and identify different types of defects in a short amount of time. In order to further ensure the accuracy of its wafer probing measurements, 19S prober uses needle offsets and multi-point prober clamping to ensure contacts are properly made with the device under test. Furthermore, the equipment has powerful image processing capabilities, which allows for intelligent detection of X-Y contact placement, as well as an advanced signal analysis suite which enables functions such as sweep and statistical analysis. TEL 19 S prober is an advanced piece of test equipment, allowing for maximum control and precision of electrical testing for integrated circuits. Its robust design, advanced motion control capabilities and array of test functions make this prober a superior choice for testing non-volatile memories and microelectronic components.