Used TEL / TOKYO ELECTRON 19S #9148301 for sale

TEL / TOKYO ELECTRON 19S (TEL/TE TEL 19S) is a production-grade surface inspection prober that is designed to provide the highest quality wafer testing and surface inspection for a wide range of semiconductor products and materials. It offers a high degree of automation, flexibility, and accuracy, making it ideal for use in advanced semiconductor test environments. TOKYO ELECTRON 19 S consists of an integrated mainframe, probe head, and vision equipment that combines into a single robotic assembly. The mainframe is a sturdy aluminum frame with a stainless steel base plate that provides a high level of precision and rigidity. The mainframe is equipped with a patented uni-directional continuous rotation and linear actuator system which combine to provide extremely precise and smooth movement of the probe head. The number of axes of movement of linear and rotary motion can be tailored to suit the specific requirements of the application. The probe head consists of a rotating P+S II bottom-level optic aligner, a source detector unit, and various sensor and probe units. The probe head utilizes advanced optics to accurately align the surface of the wafer or device and accurately measure the proximity of the surface. The sensor systems are designed for use in harsh environments and many applications requiring precise measurements. The source detector, in combination with the imaging and sensors, provides an accurate assessment of the surface for testing and inspection. This technology includes advanced 3D imaging techniques and image processing algorithms that allow for incredibly detailed and accurate surface inspection. 19 S Vision Unit is designed to provide an exhaustive scan of the test and inspection components of the prober. The imaging machine acquires 28m points per second and can measure features down to 0.01μm accurately. This allows for a detailed analysis of a wide variety of materials and parts with incredible accuracy. The vision tool utilizes many unique computerized functions that provide for extensive data acquisition, image processing, and feature extraction capabilities for superior surface inspection. TEL / TOKYO ELECTRON 19 S is designed for high reliability and superior performance in challenging environments. It provides high accuracy and repeatability for a wide range of testing and inspection scenarios. TEL 19 S also comes with a versatile suite of software that allows engineers to create robust and complex sequences of automated testing and inspection operations. TOKYO ELECTRON 19S prober is an advanced surface inspection tool that provides precise measurements and inspections for any semiconductor product or material. It combines precision motion, advanced optics, powerful sensors, and a robust vision asset for unparalleled accuracy and repeatability. 19S provides a high level of automation and flexibility with a suite of sophisticated software that enables complex testing and inspection operations.