Used TEL / TOKYO ELECTRON 19S #9221598 for sale

TEL / TOKYO ELECTRON 19S
Manufacturer
TEL / TOKYO ELECTRON
Model
19S
ID: 9221598
Prober.
TEL / TOKYO ELECTRON 19S prober is a semiconductor wafer prober used for wafer level testing and measurement of integrated components on semiconductor wafers. This versatile tool features a four-image color monitor that makes defect inspections easier and ensures that ample information is communicated and archived accurately in digital format. The prober is a high-precision positioning equipment designed and constructed according to SPC regulations or special user requirements. Its touch-screen provides a unified and intuitive operating system with a comprehensive set of probing and testing capabilities. It utilizes a combination of mechanical, pneumatic, electronic, and computerized control systems for reliable and precise operation. The prober is equipped with a Laser Interferometer For Motion Control (LIMC) unit that measures the motion of the prober's tool and sample stage. The LIMC machine reduces drive errors and ensures smooth motion at levels of repeatability and accuracy well below the micron. The prober also includes a wide variety of test inspection tools, including microscopes, measurement systems, and probing systems. These tools provide complete wafer coverage for on-site test, inspection, and failure analysis of various integrated components and circuit characteristics. TEL 19S prober is designed for wafer level fine pitch testing, with support for both standard and custom test systems. It can support a variety of test configurations, including single-pad tests, multi-contact test sites, complex probe matrix, and multi-stage tests. TOKYO ELECTRON 19 S prober is suitable for use in a variety of technical applications. Its versatile features and comprehensive support for various test systems make it a great choice for high-end semiconductor applications. This prober delivers reliable test results, superior performance, and flexibility in the testing environment. It is an excellent tool for ensuring high yields and product quality in high-volume semiconductor production.
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