Used TEL / TOKYO ELECTRON 19S #9226752 for sale

Manufacturer
TEL / TOKYO ELECTRON
Model
19S
ID: 9226752
Wafer Size: 6"
Probers, 6" 1989-1990 vintage.
TEL / TOKYO ELECTRON 19S is a prober equipment designed to automatically measure the electrical properties of semiconductor devices. It is suitable for performance and reliability testing of microchips, transistors, and capacitors. Using advanced scanning and testing algorithms, it can detect tiny variations in current and voltage across metal contacts and isolates any faulty components or circuits from the rest of the system. This ensures reliable performance and better yields of manufactured products. TEL 19S unit consists of a central measurement head and multiple independent probe boards. It enables automatic contact and probing of up to 128 test pins, delivering a wide range of advanced tests. Its automatic probing allows for simplified operation and high productivity. The machine has a programmable data acquisition rate, with fast sweep times of up to 13Kpps and a maximum sampling frequency of 2MHz. TOKYO ELECTRON 19 S also employs an advanced algorithm-based switching technique for measuring current on wafer-level test pads, allowing users to design custom measurements to suit their applications. It can measure up to 4th harmonic voltages, and can capture the shape and noise of pulsed-waveforms that are too small to see visually. TOKYO ELECTRON 19S utilizes a controller and display to facilitate the operation of the tool and provide the user with an intuitive graphical interface. It can simultaneously display time and frequency data while plotting data, and can display multiple combined measurements on a single display. In addition, TEL / TOKYO ELECTRON 19 S has comprehensive data acquisition, acquisition control, and data analysis functions. It is also compatible with a wide range of probe card designs, so users can have custom configurations that meet their testing needs. Overall, TEL 19 S offers high precision and repeatability to provide accurate results in device testing applications. With its advanced features and user-friendly GUI, it is an essential tool for any semiconductor research or production facility.
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