Used TEL / TOKYO ELECTRON 19S #9281922 for sale

TEL / TOKYO ELECTRON 19S
Manufacturer
TEL / TOKYO ELECTRON
Model
19S
ID: 9281922
Prober X-Y Stage Stroke: 184mm x 382mm Speed: 125mm/sec Resolution: 0.25µm Z Stage Stroke: Max 15mm(50µm probing) Speed: 62m/sec (up-down) Resolution: 5.0µm Angle of rotation: Max ±10 Control resolution: 0.52µm (0.000477) Driving method: Stepping motor system utility Air: 4.0kg/cm² Min: 5l/min Max: 30l Vacuum: 400~700mm/hg Ambient conditions: Temperature: 25°C ±3°C Humidity: 65% Wafer size: 3"-6" diameter Chip size: 250 - 99999µm Wafer thickness: 300~1000µm Direction of probing:X Axis Overall accuracy:15µm Max/6" Power: 220 VAC(+20% to 5%) 1.5kVA.
TEL / TOKYO ELECTRON 19S is a prober designed for the characterization and testing of nanoscale devices such as semiconductor integrated circuits (ICs) and equipment-on-chips (SoCs). This prober features an image capture system for high-resolution imaging of micro- and nano-scale devices for failure analysis, reverse engineering, yield improvement, reliability analysis, and other applications that require detailed visual inspection of devices. TEL 19S incorporates advanced electrical probing systems with a precision vector network analyzer (VNA) and an array of programmable test sockets in order to provide electrical characterization across a wide range of device types and sizes. The prober also includes additional opto-electronic testing systems for radio frequency (RF) testing, optical device characterization, and circuit timing analysis. TOKYO ELECTRON 19 S supports up to 8 test positioners, allowing for multiple simultaneous die probing operations. The prober's image capture unit also provides a host of advanced imaging capabilities such as automated 2D and 3D measurement, zoom/pan first-fail analysis, region-of-interest (ROI) imaging, area scan and stitching, film deposition thickness measurement, and X-ray pattern comparison. By combining both optical and electrical testing capabilities, 19S can quantitatively analyze the performance of devices under test and provide reliable data as well as a detailed visual representation of their condition and construction. TOKYO ELECTRON 19S is designed to operate in a wide temperature range, including extremely low temperatures, and in a variety of environmental conditions. Its state of the art temperature measuring machine allows for up to six temperature zones to be monitored simultaneously, ensuring accurate and repeatable temperature measurements across all test systems. In addition, the prober is also engineered for easy setup and program development, enabling customers to quickly create and deploy test programs with minimal effort. Overall, TEL / TOKYO ELECTRON 19 S is a highly advanced prober capable of providing comprehensive electrical and opto-electronic testing on a wide range of devices. By incorporating an array of precision sensors, vector network analysis, and imaging systems in a single package, 19 S offers an unprecedented level of accuracy and reliability for the characterization and testing of nanoscale devices.
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