Used TEL / TOKYO ELECTRON 19S #9285139 for sale

TEL / TOKYO ELECTRON 19S is a prober designed for wafer probing services. The prober is a semiconductor metrology device used to measure and test semiconductor wafers, substrates, substrates and related assembly components. It offers a wide range of functionalities such as wafer automation, data family support, and test scheduling. TEL 19S prober features a modular design which allows for efficient scalability of its capabilities. The modularity also allows for quick easy exchange of wafers and substrates without requiring the removal of the tooling and positioners. The tooling and positioners are designed to accommodate a wide range of wafer sizes, enabling high throughput processing. The included software packages provides a user friendly tool for programming and support of test scripts, setting up wafer automation and controlling test scheduling. The prober also features an automated filterless slitless optical microscope system designed for accurate analysis of wafer surface features and defects. It also allows for non-contact surface measurements via its capacitance scanning technique, which allows for high resolution imaging of topography features on the wafer surface. The device also offers a high degree of accuracy when sampling and inspecting wafers. The combination of the automated optical microscope and capacitance scanning technology allows for rapid and accurate inspection of large wafers. TOKYO ELECTRON 19 S prober is also designed for superior wafer probing performance. The prober utilizes advanced probing techniques such as self-alignment, probeless alignment, and high-frequency probing. The probe assembly is designed to be vibration-free, which allows for reliable throughput. The prober also offers tweezer-like accuracy when handling and measuring wafers, enabling a high degree of precision when inspecting, testing and sorting finished wafers. Overall, 19 S prober is a feature-rich metrology device designed to offer a variety of wafer probing, testing and sorting capabilities. Its modular design and comprehensive software packages provide users with a user-friendly way to control test scheduling, automate wafer processes and quickly exchange wafers and substrates. Its advanced probing, alignment and capacitance scanning features provide a high degree of accuracy when measuring and inspecting wafers. As such, it is an ideal tool for any semiconductor industry requiring fast and reliable wafer probing services.