Used TEL / TOKYO ELECTRON 19S #9388454 for sale

TEL / TOKYO ELECTRON 19S prober can be used to accurately measure the electrical characteristics of a wide range of devices. This prober has the ability to make contact measurements on any package type, from flip chips to traditional through-hole components. It is capable of handling up to 19 sites in parallel and enables the user to obtain both high accuracy and high throughput. The prober is equipped with a wafer handling system that can automatically stage wafers and transfer them between different test elements, ensuring all-round uniformity and repeatability during delivery. Its multi-site measurement feature enables quanitance measurements, which means that 19 sites can be tested at once on the same wafer, resulting in time savings and reduced calibration costs. In addition, the prober uses a computer-controlled thermal management system, which ensures consistent and precise temperature settings across all sites in order to achieve reliable results. The prober has a non-contact tape measure for accurate pre-characterization of the wafer. This feature eliminates the need for manual probing and can help to reduce the time taken to process the wafer. In addition, the prober includes an intuitive, user-friendly software interface that provides a range of features including the ability to design tests, create plan and run tests, and analyze results. This makes the prober suitable for many types of testing. The prober also features a comprehensive DC, LV and RF test platform, and its compact size allows it to fit into most production lines. It can handle wafer sizes up to 8" in diameter, allowing for a wide range of testable components, and its large sample load capacity allows it to handle higher order amounts. In addition, it has a built-in fast data transfer rate, allowing for efficient data transfers. TEL 19S prober is an ideal choice for wafer and device testing and characterizing applications, allowing for streamlined processes and high accuracy readings. With its user-friendly software interface and comprehensive test platform, it offers users the convenience, speed and reliability needed to ensure successful wafer and device testing.