Used TEL / TOKYO ELECTRON 20S #9270099 for sale

TEL / TOKYO ELECTRON 20S is a versatile and powerful prober that provides accurate results in various testing and probing applications. It is a portable and compact probe station designed to accommodate multiple substrates ranging from 200 to 300 millimeters (mm). TEL 20S prober offers a dual-axis translation stage with motorized stages for precise and accurate alignment. The prober surveys and aligns the substrate, then programs the required scanning path. The scan can easily be done in two-dimensions (X and Y). The dual-axis stage has a self-centering capability for easy probing and accuracy. The prober is capable of carrying out wafer testing at varied configurable optics including reflectometry, darkfield, brightfield, and differential imaging. Additionally, the prober is equipped with optical alignment tools to optimize image acquisition during wafer testing. Using an Integrated Voice Response (IVR) equipment, users can communicate with the system through a touch-screen interface. The IVR unit enables quick and easy access to the machine's functions, as well as providing voice feedback as the prober operates. TOKYO ELECTRON 20S prober also contains a comprehensive range of probes, including a conductivity probe, an E-beam box, an optical detector and microscope, and a scanning tunneling microscope (STM). This allows a broad range of applications such as surface inspection, conductivity testing, E-beam lithography, and STM analysis. In addition to the core capabilities, the prober also has a built-in auto-tunning facility and image-analysis functions. This allows for fast and efficient testing of semiconductor wafers. The prober is also built with noise-suppression to minimize the impact of environmental noise, as well as a hot chuck adapter for easy access to the wafer surface. Furthermore, the prober is also equipped with additional features such as a viscosity-thickness control, which allows accurate measurements of different materials placed on the prober. It also includes an auto-retrieval tool that can quickly detect probe misalignment. 20S prober is the ideal tool for semiconductor wafer testing and probing. Its combination of features and accuracy makes it an invaluable tool for any application that requires testing and probing of a variety of substrates.