Used TEL / TOKYO ELECTRON 20SR #27536 for sale

TEL / TOKYO ELECTRON 20SR is a prober used in semiconductor device manufacturing for the purpose of testing and inspecting integrated circuits. It has a built-in high-precision CAD equipment enabling users to accurately design and simulate complex network structures. The system also allows users to create and store custom template designs. The prober includes a membrane chuck and an automated Z-axis mechanism that allow probing of wafers in a wide range of diameters. The high-precision, three-dimensional design allows contact displacement to be accurately and rapidly adjusted while maintaining tight control over wafer motion. Its fast scanning speed and powerful electronics make TEL 20SR fast and reliable. The unit incorporates a contact sensing function that accurately diagnoses problems in the probing operation. This machine also features an internal calibration function which ensures optimal operation, as well as a variety of automated measurement functions for faster, more accurate results. TOKYO ELECTRON 20 SR also offers several connection options, allowing users to connect to other instruments and remote systems. TEL 20 SR is capable of providing exceptional performance under challenging operating conditions, including high temperature and vibration. Its sealed body ensures that no dust or contaminants can enter, preventing contamination of the probe tips and ensuring reliable data. Its durable construction ensures stable performance and long-term reliability. TEL / TOKYO ELECTRON 20 SR can accelerate device test and probe throughput thanks to its low-temperature shock resistance and its superior signal-processing ability. It is also known for its ability to maintain high-accuracy probing despite rapid scanning rates and high temperatures. This provides higher yields and a faster time to market from design to fully validated and tested devices. 20 SR also facilitates advanced data logging capabilities, allowing users to store, collect and analyze probing data for later analysis. This feature makes the prober ideal for quality control, data recording and analysis for complex device designs, as well as the conduction of reliability tests to ensure robustness of the prober and production environment. Overall, 20SR is an excellent choice for probing systems with advanced design capability, reliability and performance, making it a top-tier choice for today's ever-evolving semiconductor device manufacturing markets.