Used TEL / TOKYO ELECTRON 20SR #293793629 for sale

TEL / TOKYO ELECTRON 20SR is an advanced wafer prober designed to facilitate the testing of advanced Packaged Devices (APD) and probe cards in wafer level semiconductor fabrication. This advanced prober features a compact design that is capable of accommodating the latest and most advanced APDs and other device components. It has a high performance temperature control equipment and is equipped with a new scan measurement system. Additionally, it features an improved load table design and a new high resolution image display. TEL 20SR is a fully automated unit that supports advanced procedures and allows for quickly changing applications. Its advanced temperature control machine provides high precision, repeatable temperatures eliminating the need for manual adjustment and calibration. Its integrated scan measurement tool allows for faster measurement data acquisition and analysis of advanced device components. The improved load table design ensures precise device loading with less drift and thus more reliable test results. Additionally, the improved table design eliminates the need for manual centering and minimizes die tilt damage due to misalignment. TOKYO ELECTRON 20 SR also has an improved high resolution image display that improves visual pattern recognition during testing. This feature offers the advantage of tracking particle counts and other pertinent defects while testing. The prober also has a precise programmable indexer and auto-leveled wafer susceptor, which allow for accurate positioning of the device for testing. 20 SR is an ergonomic and user friendly device that offers a versatile range of testing tools. It provides advanced features such as computer control, data logging, analysis capabilities, and network connectivity for real-time data collection and analysis. Its compact design ensures tight environmental control, allowing testing to be done with no additional equipment. Overall, TEL / TOKYO ELECTRON 20 SR offers a comprehensive wafer prober solution for testing APDs and other devices in wafer level semiconductor fabrication. Its advanced features and superior performance make it the ideal choice for today's demanding semiconductor fabrication tasks. By offering a wide range of testing capabilities and features, TEL 20 SR is the ideal choice for reliable and accurate device testing.