Used TEL / TOKYO ELECTRON 20SR #9131943 for sale

TEL / TOKYO ELECTRON 20SR is a prober that is designed to help engineers test and inspect wafers for higher levels of performance and accuracy. The probe includes a high-resolution charge coupled device (CCD) imaging equipment, and a charge detector used to estimate the electrical characteristics of a device. This system enables the device to be monitored and analyzed in a highly precise and accurate manner. At the heart of TEL 20SR is the CCD imaging unit. This machine is designed to capture very precise images of the device, allowing for detailed analysis. The CCD imaging tool features a high resolving power, ensuring that any errors and defects in the device can be identified easily. The imaging asset is also capable of providing digital images at high speeds, making it suitable for short test cycles. The charge detector also found in TOKYO ELECTRON 20 SR helps to measure the electric field of a device and the electrical characteristics associated with it. This data helps engineers to understand the properties of a device much better, making it easy to identify any problems or issues related to the device. In addition to measuring electrical characteristics, the charge detector is also capable of measuring noise levels, therefore providing further insights into device performance. The probe is controlled by an intuitive graphical user interface (GUI). This allows users to easily adjust settings to suit specialized testing situations. This allows for more efficient and accurate testing, allowing engineers to accurately identify any problems or issues associated with the device. 20 SR also supports data storage, allowing engineers to keep accurate records of the device under test. This helps to improve quality control and allows for improved performance tracking. Overall, TEL / TOKYO ELECTRON 20 SR is a sophisticated and accurate prober that can help engineers test and analyze wafers with superior levels of accuracy and precision. The high-resolution CCD imaging model and charge detector ensure that any problems associated with the device are identified quickly and accurately, while the intuitive GUI allows for easy adjustment of settings for specialized testing environments. Furthermore, the data storage feature helps to improve quality control by keeping accurate records of device performance.