Used TEL / TOKYO ELECTRON 20SR #9132504 for sale

TEL / TOKYO ELECTRON 20SR is a prober for specialized semiconductor testing and device evaluation. This equipment uses both impedance and capacitance measurements to measure and evaluate a variety of semiconductor materials and components. It is designed to measure the device structure, interface, or contact characteristics of any given component. The prober can also be used to measure the performance of transistors, MOSFETs, CMOS, and other semiconductor devices. TEL 20SR prober uses an advanced high-resolution scanning electron microscope (SEM) to generate a 3-dimensional image of the device surface. It also uses sophisticated software to analyze the resulting image. The system can detect and measure surface irregularities, such as bumps, voids, and cracks, as well as measure the distribution of characteristics such as grain size and grain orientation. TOKYO ELECTRON 20 SR can detect and evaluate small particles, contaminants, metallurgical structures, and crystalline defects. The unit is equipped with state-of-the-art metrology features, including laser surface metrology. This allows for accurate and precise measurements of the device structure, surface, or contact characteristics. The machine also has an automated metrology tool for evaluating a range of devices. This makes it easier and more efficient to evaluate the physical characteristics of the device without having to manually set up measurements. For measurements of electrical characteristics, TEL / TOKYO ELECTRON 20 SR has an impedance parameter analyzer. It is capable of analyzing the impedance of the device at different frequencies. It can also measure the capacitance of a device, or an insulation layer, with accuracy of less than 1 picofarad. This asset has a highly sensitive voltage meter with a range up to 4.5 volts. TOKYO ELECTRON 20SR can operate at temperatures up to 300°C. Its sample temperature control ranger can be set up to 500°C, allowing for high-temperature measurements and testing. The model also offers a variety of automation features, such as a scan list editor, which can be used to create and store repeatable test sequences. In summary, TEL 20 SR is a versatile and accurate prober for specialized semiconductor testing and device evaluation. It uses advanced high-resolution scanning electron microscopy and sophisticated software to analyze the resulting image. It has a variety of metrology features, including laser surface metrology, for measuring the device structure, surface, or contact characteristics. It also has an impedance parameter analyzer for testing electrical characteristics, as well as automated features for efficient device testing and evaluation.