Used TEL / TOKYO ELECTRON 20SR #9132519 for sale

TEL / TOKYO ELECTRON 20SR prober is a state-of-the-art, ultra-high-precision wafer prober designed for wafer level testing of semiconductors. It is capable of handling a wide range of wafer substrates, from thin-film crystalline and commercial silicon wafer sizes up to 200mm. TEL 20SR prober is built with a highly reliable design and a virtual library of wafer probing programs. It offers a high level of flexibility and is capable of inspecting various test sites, including integrated nanostructures and microstructures down to 5µm with its advanced nanometrology functionality. TOKYO ELECTRON 20 SR prober features a robust design with high precision, high stability, and minimal thermal drift. It is capable of achieving exceptional flatness and is designed to deliver reliable test results within <10us settling time. The equipment can accommodate up to 14 sample receptacles, and its integrated camera system allows users to monitor each sample as it is being tested. It also features an intuitive Windows-based graphical user interface and automated diagnostics for quick and easy troubleshooting. TEL 20 SR prober utilizes two separate types of optics. The first is focused infra-red confocal measurements of nanostructures and integrated structures, and the second is a top-view optical microscope for visual inspection. The combination of these technologies allows the prober to accurately measure sizes, shapes, and locations of circuit elements and to detect vacancies, shadowing, and flipping of elements. The prober has an optical resolution of up to 8µm, and its integrated circuitry minimizes crosstalk between test sites. 20 SR prober is capable of producing high-accuracy X,Y, and Z motions with a positioning precision of 0.01µm. Its advanced imaging unit integrates a high-resolution CCD camera and a binocular microscope machine, allowing precise positioning of probes for optimal readings. Additionally, the prober utilizes high accuracy width and height measurement for locating and probing cavities within the integration substrate. This ensures that all test results are precise and reliable. Overall, 20SR prober is an advanced, reliable, and highly capable wafer testing tool. It offers a versatile, flexible platform for semiconductor fabrication measurements, and its ability to process multiple samples with simultaneous quality assurance ensures that the highest levels of test accuracy and precision achievable.