Used TEL / TOKYO ELECTRON 20SR #9132530 for sale

TEL / TOKYO ELECTRON 20SR is a semiconductor prober developed by TEL Ltd. (TOKYO ELECTRON). It is a highly automated, advanced wafer probing equipment designed for maximum efficiency and throughput. It is ideal for new product developments, process and device characterization, and yield and quality assurance. TEL 20SR offers a fully automated probing capability, with a range of features to optimize efficiency and enable rapid development cycles. It is capable of probing along two axes, utilizing a tool changer to switch between pads and probes on the same wafer. It also has an automatic re-zeroing system for efficient data collection on each wafer. TOKYO ELECTRON 20 SR is constructed with a CCD camera, an XY stage, a quartz crystal resonator, a laser backscatter detector, and a patented "Pin Measurement Unit" (PMS). The PMS enables the parallel processing of multiple wafers for quick and accurate data collection. The machine also includes advanced software for efficient monitoring and data analysis. 20SR is also equipped with a number of automation features to reduce manual labor costs associated with the probing process. It is capable of fully automated operation of the XY stage, probe detection, probe position adjustment, tool changer, pad alignment, wafer orientation adjustment, and automated re-zeroing. This makes it possible for the tool to run unattended for extended periods of time with minimal user intervention. TEL / TOKYO ELECTRON 30SR is the next generation of semiconductor prober, offering enhanced features and user capability over TOKYO ELECTRON 20SR. It has a much larger XY stage and is compatible with a wider range of probes and pads to enable more accurate probing. It also includes a wider range of automated systems, including an audio centering asset for improved process efficiency. TEL / TOKYO ELECTRON 20 SR is a high-quality prober for a wide range of applications in the semiconductor industry. It offers a fully automated probing capability, with a range of features to optimize efficiency and enable rapid development cycles. It is also designed to reduce manual labor costs associated with the probing process. As a result, the model is ideal for process and device characterization, as well as yield and quality assurance.