Used TEL / TOKYO ELECTRON 20SR #9132691 for sale

TEL / TOKYO ELECTRON 20SR is an advanced prober designed for wafer inspection with extremely high accuracy and speed. TEL 20SR is used for probing wafer edges, beaks, and to inspect and measure the quality of the wafer surface. It also provides automatic wafer analysis delivered in both graphical and tabular formats. TOKYO ELECTRON 20 SR is equipped with a static measuring equipment that can measure the tiniest differences on wafer surfaces. This system is composed of two parts, the Strobe Sensor, which detects even the faintest variations in surface conditions, and the Probe Sensor, which detects any irregularities. The measurement results are simultaneously stored in a database to minimize the risk of human errors. The manual writing on the wafer surface can also be easily read by TOKYO ELECTRON 20SR. Its advanced auto focus unit automatically adjusts the sensor's focus point to capture the manual writing clearly. The results are displayed clearly in a graphical representation on a large LCD screen. In addition, TEL / TOKYO ELECTRON 20 SR is equipped with a non-contact accuracy measuring machine which is capable of detecting minute deviations from the target thickness of wafers. This tool consists of a probe head adaptable for flat wafers and semiconductor wafers for non-contact accuracy measurement. The prober also comes with a custom-made parameter setting for fast and easy data transfer to a connected PC. This feature allows users to transfer data quickly and makes it easier to configure the wafer inspection software. TEL 20 SR's wireless connection also enables remote data transferring from a distance. To ensure data accuracy, 20 SR also features a double-checker asset which enables users to double-check any variation in the evaluation results. This double-checker model provides more accurate results for wafer inspection and quality control. Overall, 20SR is an advanced prober designed for wafer inspection with high accuracy and speed. With its Auto Focus Equipment, Non-Contact Accuracy Measuring System, and Double-Checker Unit, users can easily inspect and measure the quality of the wafers and quickly transfer data with its customized parameter settings.