Used TEL / TOKYO ELECTRON 20SR #9132747 for sale

TEL / TOKYO ELECTRON 20SR
Manufacturer
TEL / TOKYO ELECTRON
Model
20SR
ID: 9132747
Vintage: 1991
Probers, 1991 vintage.
TEL / TOKYO ELECTRON 20SR is a prober designed for testing and inspecting integrated circuits (ICs) and other microelectronic devices. It offers superior performance, reliability, accuracy, and speed in a compact package. TEL 20SR features a high-resolution display, allowing users to view detailed images for a precise analysis. The system also features a dual-channel electron beam for simultaneous probing of multiple points, a beam-deflector for a range of scan angles, and a low disturb mode for sensitive areas of the device under test. The system uses built-in metrology systems to monitor and maintain a uniform testing environment. It utilizes precision motion control systems to ensure repeatability and accuracy while inspecting ICs and other device features. TOKYO ELECTRON 20 SR also includes an analytical beam for in-situ imaging of device structures. Using this beam, users can observe circuits in real time during the probing process. TOKYO ELECTRON 20SR prober is designed to be used in a cleanroom environment. It features a low-profile enclosure, and the head can be operated in remote locations for increased flexibility. It features integrated I/O ports, allowing it to be connected to a variety of network interfaces. It also supports a variety of automation technologies, such as script-based automation and shared control. Additionally, the system is equipped with a servo control board that permits manual control over all motors, making it an ideal solution for customization. TEL 20 SR prober provides an ideal solution for testing ICs and other microelectronic devices. It offers high-resolution imaging, fast probing speeds, and precise metrology systems. Its low-profile enclosure offers a cleanroom-compatible design, and integrated I/O ports enable connection to a variety of network interfaces. It also features precise motion control systems and versatile automation technologies that allow for precise probing of intricate device structures.
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