Used TEL / TOKYO ELECTRON 20SR #9284134 for sale

TEL / TOKYO ELECTRON 20SR is a highly advanced prober designed specifically for the semiconductor industry. It is a fully automated contact sensitivity prober that is capable of testing and probing a wide range of semiconductor applications. The prober is comprised of a highly optimized electronics module, a numerical-control motion equipment, and a high-precision alignment head. TEL 20SR is engineered with advanced features for reliable and precise contact testing. The prober is designed with a particularly rigid frame for a robust level of contact stability. The position acquisition system is designed for accurate and stable absolute linear positions of the contact points on the device, allowing for consistent and reliable connections. The prober also utilizes a micro-force sensor that continuously measures force variations between the probes and the device, for improved contact sensing. TOKYO ELECTRON 20 SR is equipped with several motion systems that provide its users with a wide range of measuring capabilities. These include multi-axis motions, both linear and angular, as well as precision position detection. The prober is also able to measure both fine and coarse structures with flexibility and accuracy. It is also designed to be able to work in both parallel and repositioning mode for accurately testing and probing complex patterns. The prober's high-precision alignment head is designed to facilitate accurate device placement for precise and confident locations on the device. The unit is also equipped with a built-in self-test mode for checking the proper functioning of the machine, as well as a calibration routine. for long-term accuracy and repeatability of the probing process. TEL 20 SR is built with an array of safety features that ensure the safety of both people and product. Its self-test routine can also continuously monitor the integrity of the prober's performance as it moves across the device. The machine is built to automatically shut down in the event of an external force or motion, such as an accidental shock or vibration. Finally, the prober is also designed with a safety glass to protect against potential accidents while testing and probing.