Used TEL / TOKYO ELECTRON 770-933001-000 #9281038 for sale

TEL / TOKYO ELECTRON 770-933001-000 is a prober for measuring semiconductor devices, such as transistors and integrated circuits (ICs). The prober has a number of features that make it suitable for use in a variety of semiconductor test procedures. The prober has a large number of adjustable parameters including voltage, current, frequency, impedance, capacitance, resistance, channel count and duty cycle. The prober also has a range of signal generators and a selection of inputs and outputs. These parameters allow the user to control the electrical characteristics of the prober. The prober also provides a way to map out the physical layout of the device and its connections. The prober also has a low noise circuit and display which allows the user to measure, monitor, and adjust the device during testing. This display can also be used to map out the physical layout of the device and its connections. The prober also has a number of safety and environmental protection features. It has a high voltage measurement circuit to protect against short circuits and the potential for shock. The prober also has thermal protection, an isolated power supply, and a self-contained NIST traceable calibration system. The prober has a selection of interconnection ports, including RF, LAN, and USB. The user can use these ports to connect the prober to other test equipment. The prober also has a USB interface that enables software control of the prober. This allows for remote control, monitoring, and logging of test results. The prober has a durable aluminum housing that provides protection from dust and moisture. The prober is designed to measure small parts with high accuracy and repeatability. The prober has a wide range of performance parameters, including high frequency, low frequency, and long-term stability. The prober has a low power consumption and is designed to operate in a wide range of temperatures and environmental conditions. TEL 770-933001-000 is an advanced prober that is suitable for use in a variety of semiconductor test applications. It has a large number of adjustable parameters, a range of signal generators, a low noise circuit and display, interconnection ports and a USB interface for remote control. The prober is also designed to operate in a wide range of temperatures and environmental conditions. The prober has a durable aluminum housing and is designed to measure small parts with high accuracy and repeatability.