Used TEL / TOKYO ELECTRON 78S #9114134 for sale

TEL / TOKYO ELECTRON 78S (TE TEL 78S) is a prober designed for wafer probing, known as wafer probing. This prober is capable of performing a wide range of wafer probing applications such as electrical parameter testing, device characterization, and electrical reliability testing. The TE TOKYO ELECTRON 78 S was designed with a high degree of precision, allowing it to quickly and accurately test a variety of components on silicon wafers such as DRAMs and CMOS devices. The prober's main feature is its three-axis positioning capability. It is capable of positioning a variety of probes for electrical connections for various testing applications. It uses a Dual Reference Probing Equipment (DRPS),which compensates for planarity variations in the wafer surface, allowing for accurate contacting of the probes with the test structures. This ensures a low cycle time and enhanced data accuracy by reducing contact bouncing and ensuring good contact throughout the probing process. In addition to its positioning system, the TE 78 S features five motion control systems including the X, Y, and Z axes for top-level probing positions and the R and P axes for fine adjustment. Thisallows for intuitive and repeatable setting of probes over the wafer, leading to improved accuracy and repeatability. It can support a wide range of speeds up to 25mm/sec, with a resolution of 0.1 um. The TE TEL / TOKYO ELECTRON 78 S also features a number of advanced features, including a programmable high voltage protection unit and an optional alignment scanner. The protection machine allows for a precise amount of current to flow through the probes, preventing damage to the devices and protecting test personnel from electric shocks. The alignment scanner is a high-speed vision tool for aligning the probes with test structures, reducing contact failure and cycle times. The TE TEL 78 S is also equipped with ancillary support systems, such as a drying asset, an optional automatic error recovery model, and a built-in data acquisition equipment. The drying system uses a heated nitrogen gas to dry any moisture from the wafer before performing any testing, while the recovery unit detects and corrects any errors in the probing process before they can affect the test results. The data acquisition machine allows for the testing of parameters such as voltage, current, and capacitance. The TE TOKYO ELECTRON 78S is a powerful and versatile wafer prober, designed for precise and accurate wafer probing applications. It has a number of features that make it well-suited for a variety of testing requirements, offering reliability and accuracy. The TE 78S is an excellent choice for any demanding testing application.