Used TEL / TOKYO ELECTRON 78S #9132752 for sale

TEL / TOKYO ELECTRON 78S is a high-precision, multi-functional prober developed by TEL Limited. This sophisticated equipment is designed to accurately measure the electrical characteristics of a variety of substrates such as ICs, semiconductors, and passive components. TEL 78S is designed to perform both isolation and contact probing with an integrated controller and software. It can analyze complex devices that are not easily measured with conventional tools such as high integrated, 3D-stacked and high-density packages. TOKYO ELECTRON 78 S prober system consists of two main components - the master unit and the prober heads. The master unit controls the mounted components including the motor, drives, measuring device, and a precision monitoring unit. This unit is also responsible for communication between the various machine parts. The prober heads are the actual measurement and contact probes. They are mounted directly onto the movable platform and are connected to the controller and measurement device. All of these components work together to provide accurate and reliable measurements. TEL 78 S has a wide variety of features. It has a fast scanning speed that can measure up to 118 pins per second, allowing for quick analysis and response time. It also has a variety of measurement functions that include contact, isolation, parameter and resistance measurements. Additionally, TEL / TOKYO ELECTRON 78 S has an automated grounding tool that ensures a proper electrical connection between the probes and substrates. Furthermore, the asset's built-in software enables both manual and auto-calibration of the measuring model. This feature ensures accuracy when performing critical measurements such as package footprint and pad pit measurement. Additionally, the prober can perform die attach probing without causing any damage to the test device. TOKYO ELECTRON 78S is designed with a high level of accuracy and precision. The equipment is designed to maintain a stable temperature environment and eliminate environmental noise disturbances that could interfere with the measurements. Its wide variety of features and accurate performance make it an ideal tool for device validation and yield improvement.