Used TEL / TOKYO ELECTRON 78S #9260826 for sale

TEL / TOKYO ELECTRON 78S
Manufacturer
TEL / TOKYO ELECTRON
Model
78S
ID: 9260826
Wafer Size: 8"
Prober, 8".
TEL / TOKYO ELECTRON 78S is a Probe Card prober that is designed for accurate electrical contact between two components. It is capable of testing the performance of a variety of semiconductor devices such as memory chips, logic circuits, control circuits, and display panels. The Prober offers high-speed probing, fast probing cycles, and long-term reliability thanks to its low-vacuum equipment and advanced contact technology. TEL 78S is a compact prober that is designed to be easily set by the user. The system has a digital I/O board and is easily accessed via software, allowing for easy setup by the user. The unit includes an I/O controller, an optical microscope, an electromagnetic probe, and a scanning electron microscope (SEM). A variety of probes, including laser-based contact probes, are available, allowing for the user to customize the type of test being used. TOKYO ELECTRON 78 S also features a high-speed probing machine which offers accurate and reliable results. This probing tool uses a digital trigger and digital to analog converters to accurately measure the electrical activity in the device under test. The asset also has advanced integration and feedback controls, which can be used to customize the settings of the prober. TEL / TOKYO ELECTRON 78 S includes an analysis model which is used to observe and measure the electrical activity of the device under test. The equipment is able to measure voltage, current, frequency, resistance, and capacitance. The data can then be used to analyze the performance of the device. The analysis system also has sophisticated data acquisition controls which allow for more precise measurements. 78 S prober is designed with performance and reliability in mind. Its compact design makes it easy to use and transport, and its high quality probes and electromagnetic probes guarantee accurate and fast probing. The advanced contact technology also ensures a reliable electrical connection between components, and the integrated analysis unit helps to ensure accurate performance testing of the device.
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