Used TEL / TOKYO ELECTRON 78S #9354472 for sale

TEL / TOKYO ELECTRON 78S is a prober equipment designed for semiconductor wafer probing and interface testing. The unique design of TEL 78S allows for superior accuracy with minimal impact on production yields. The body of the system is designed to minimize vibration, allowing for higher probing rates than other prober systems. The unit is equipped with its own specialized probing card and a choice of needle probes and socket contacts. It utilizes a superior half bridge balance machine to ensure accuracy and repeatability of measurements. The tool is also designed to facilitate high speed probing operations. It has an advanced position control asset that enables waveforms to be acquired at speeds up to 10MHz. In addition to the prober itself, the model also incorporates multiple high-performance control units for automation processes. The control units are modular in design for efficient equipment upgradeability. It also uses a CAN/I2C protocol for easy data transfer from unit to unit. TOKYO ELECTRON 78 S utilizes an advanced current-measuring system to allow for precise and repeatable measurements. The unit is designed with a closed-loop current-measuring machine to ensure accuracy and stability when measuring currents. The tool is also designed to monitor and adjust signal parameters in real-time. TOKYO ELECTRON 78S also incorporates an advanced vision asset to allow for automated alignment and targeted probing operations. The model uses a CCD camera with precision optics to ensure accurate and repeatable measurements. 78S is designed with a pneumatic equipment to enable calculation of a wide range of contact forces. The system is also designed with an easy-to-follow operation scheme, allowing for high throughputs and a programmable wafer-sensing unit. Overall, 78 S is a dynamic and superior prober machine that utilizes high-accuracy instrumentation, advanced automation, and vision systems to ensure repeatability and accuracy of measurement. It is a must-have for any modern semiconductor wafer probing and interface testing environment.