Used TEL / TOKYO ELECTRON 78S #9362297 for sale

TEL / TOKYO ELECTRON 78S prober is an advanced, highly capable surface mount cable test system designed for high velocity and accuracy. Its features include low noise, high precision, and high reliability. TEL 78S prober is suitable for high throughput testing of both single-chip and multi-chip integrated circuits. TOKYO ELECTRON 78 S prober utilizes vacuum pressure to press the prober probe against the DUT, ensuring electrical contact between the prober and the device under test. This is further aided by the prober's clean-room compatible, ultra-low noise aluminum armature with a stainless steel contact spring. The prober has a wide range of application support, including a wide range of ICs and packages such as QFPs, SOICs, BGAs, and plastic leaded chip carriers. TEL / TOKYO ELECTRON 78 S prober is highly accurate, with a positional accuracy of +/- 0.1 microns, limited by the probe size. The prober has an adjustable stage resolution of 30 to 50 microns, ensuring precise placement for non-probe level measurements. The prober also features a fast scan speed, with a maximum scan speed of 200 kHz. TOKYO ELECTRON 78S also features a user-friendly design and intuitive graphical user interface. This user-friendly design is coupled with a powerful and robust suite of integrated features, such as on-board controllers, sophisticated test sequencers, dip switch and external control logic implementation, and much more. 78S is a versatile system that can be configured for a wide variety of testing applications. It is also highly scalable, with the ability to be expanded to support additional test probes, extra mass memory, additional drivers or channels, and even the installation of additional modules, such as environmental test chambers, parametric measurement systems, and vision systems. In conclusion, TEL 78 S prober is an advanced, ultra-precision, highly reliable, and easy to use surface mount cable test system. Its broad range of features, including its low noise design, accuracy, user-friendly interface, scalability, and compatibility make it an ideal choice for testing fragile and complex ICs in applications requiring high throughput and accuracy.