Used TEL / TOKYO ELECTRON 78S #9375759 for sale

TEL / TOKYO ELECTRON 78S is a probe station manufactured by TEL Limited for wafer testing. It is designed for high-efficiency electrical testing of silicon wafers and electronic components. The station provides both precise mechanical positioning and accurate electrical measurements. It consists of a two-axis linear motion stage and an adjustable probe arm. The probe arm supports up to 16 probes, each with a single axis of motion that can be manually adjusted, offering flexibility for a variety of measurements and tests. The adjustable angle of the probe stage also helps to precisely modify the contact angle between the probe tip and the product. The two-axis linear motion stage provides precise, configurable motion in both X-axis and Y-axis directions, and can be configured for movements ranging from 0.5mm to 75mm. The automated equipment includes a programmable system controller with an intuitive interface, allowing users to configure repeatable testing conditions quickly and easily. Through the programmable unit controller, users can set multiple steps for wafer testing, configuring the wafers' X/Y translation speed as well as the speed, force, and duration of wafer probing. The controller also allows users precise control over the sampling area and the number of contact points. TEL 78S is designed with specialist safety features, such as a door interlock machine, key switch access, automatic shut-down mode, and fault detection. These features make the tool both safe and reliable, helping to minimize the risks of errors or accidents. The equipment is highly reliable and designed for years of continuous use. Low vibration ensures stable measurement conditions, while the precise motion stage allows for accurate, repeatable motion in both X and Y directions. The high-precision measuring asset is accurate to within ±1μm with low drift, maintaining accuracy and repeatability through long runs. Overall, TOKYO ELECTRON 78 S is an excellent wafer testing model for precision electrical and mechanical measurements. Highly reliable and accurate, it offers numerous configurable options, precise positioning, and safety features. These features combine to make this an excellent probe station for increasingly demanding wafer testing applications.