Used TEL / TOKYO ELECTRON 78S #9375762 for sale

TEL / TOKYO ELECTRON 78S is a semiconductor prober designed for the testing and characterization of the electrical, optical, and thermal performance of semiconductor wafer components. The prober has state-of-the-art specifications that enable precise and accurate monitoring of a wafer's performance parameters. The powerful TEL 78S is equipped with a 4-axis motion-control system which allows for precise probe placement. It is also equipped with a 16-bit temperature controller for temperature stability and precision, a strain gauge to enable fine strain measurements, and an optical head for optical characterization. The prober measures a wide range of electrical parameters including current, voltage, capacitance, and resistance. This makes it useful for the engineering of advanced electronic products. Its optical characterization capabilities range from analysis of spectral characteristics and electrical-optical components like PN junctions, LEDs, and OLEDs. TOKYO ELECTRON 78 S is capable of wafer-level testing. This means that the probe can simultaneously test multiple semiconductor components on one wafer. It also possesses an integrated wafer-handling system that allows for automatic loading, unloading, and alignment of the wafer, all without any operator intervention. The prober also has a built-in sample database, allowing for real-time analysis and data comparison. This means that test results can be quickly compared to a previously stored sample. In addition, 78 S is able to write data directly to its own database. This allows for complex investigations of the parameters tested, with results presented in graph and chart formats. Overall, TOKYO ELECTRON 78S is an incredibly powerful and versatile tool for the monitoring and characterization of the performance of semiconductor wafer components. With its state-of-the-art measurements and features, it's an excellent prober for engineers developing advanced electronic products.