Used TEL / TOKYO ELECTRON 80S #9132188 for sale

TEL / TOKYO ELECTRON 80S is an automated semiconductor wafer prober designed for electrical testing and failure analysis of semiconductor ICs. This probe station offers precise fine positioning, high accuracy movement, and digitally controlled down-probing. It provides a fully automated equipment utilizing the latest in CCD laser-based alignment technology as well as vacuum chamber design for wafer level measurement. TEL 80S is an advanced wafer loading prober that allows for precise placement of semiconductor dies on the probing table. It has a low thermal dissipation design that enables temperature control with a wide dynamic range. Its 3-axis scanning and 4-axis probe positioning system provides high accuracy, high speed, and micro-second response for moving, placing, and probing measurements. TOKYO ELECTRON 80S is a highly automated platform optimized for probing wafer level integrated circuits. The platform contains several features designed for ideal sample probing. It has a loadlock unit and integrated Auto Chuck machine (ACS) for handling large samples up to 8 inch wafer size. The integrated vision tool offers fast and accurate alignment and calibration in the first image. Its ultra-low drift vacuum allows for highly efficient probing. A patented probe holder design helps protect delicate probes from mechanical damage during operation. 80S has several optional features that increase its functionality and accuracy. These include contact and non-contact probing systems, multiple probe in/out capability (for accessing multiple dies in parallel), fast exchange of probe tip spacers, metallic covers for wafer protection, and various cleaning options. The prober also has optional in-situ heat dissipation, aligned to wafer orientation. This helps to reduce overall probe time and minimize thermal gradients between probe pins and their adjacent pads. Moreover, TEL / TOKYO ELECTRON 80S also offers a number of advanced diagnostics capabilities, including signal integrity, monitoring, and spectrum analysis. Its advanced digital software capabilities provide the flexibility to customize and modify probing parameters, as well as store, retrieve and replay test data. The platform also offers sophisticated scripting options, allowing users to easily customize and automate test patterns. Overall, TEL 80S is an advanced, highly automated prober asset designed for efficient probing of the latest generation of semiconductor ICs. Its accuracy, speed and overall features enable precise probing of difficult shapes with fast cycle times. The model is reliable and offers several optional configurable options for maximum efficiency.