Used TEL / TOKYO ELECTRON / ACCRETECH / TSK F 200SA / ML7112 #9306148 for sale

TEL / TOKYO ELECTRON / ACCRETECH / TSK F 200SA / ML7112
ID: 9306148
Vintage: 2008
Automatic laser scratch system 2008 vintage.
TEL / TOKYO ELECTRON / ACCRETECH / TSK F 200SA / ML7112 is a prober designed for semiconductor device wafer probing. It is a compact, self-aligning automated prober that is capable of handling wafers with large dies, from 4 to 8 in size, and can be mounted with a variety of pins. This prober has an advanced auto-focus equipment that can automatically detect the location of the device on the wafer and accurately probe it. It is a reliable, accurate and high-throughput prober. TEL F 200SA / ML7112 features a high-precision mechanical system that can perform a wide variety of probing tasks such as sorting and measuring. The prober boasts a fast, efficient, and secure probing procedure that is highly reliable and can accurately and rapidly detect even the smallest faults in the assembly. Moreover, the prober is equipped with several cutting-edge features and technologies. It offers a low-voltage scanning unit for better accuracy and stability, and is capable of quickly scanning up to 80 sites per second, while ensuring accurate alignment. Furthermore, the prober can measure over the entire wafer, including the edges. The data collected can be stored in memory for later processing. TSK F 200SA / ML7112 also features advanced in-line test strategies that make testing more efficient. These strategies can be configured to accommodate various sizes and technology nodes. The prober also features a touch panel display and PLC machine that allow users to easily access and configure settings to precisely control process parameters. As well, the prober has a semi-automatic calibrator that can perform alignment checks and fine-tune the process as needed. TOKYO ELECTRON F 200SA / ML7112 is a highly reliable and advanced prober that combines cutting-edge technologies with efficient operation. It offers high-precision testing for a wide variety of applications, making it an ideal choice for semiconductor device wafer probing.
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